The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Nov. 27, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Sanjiv Das, San Jose, CA (US);
Michele Donini, Berlin, DE;
Jason Lawrence Gelman, Los Altos, CA (US);
Kevin Haas, Los Gatos, CA (US);
Tyler Stephen Hill, Los Altos, CA (US);
Krishnaram Kenthapadi, Sunnyvale, CA (US);
Pinar Altin Yilmaz, Palo Alto, CA (US);
Muhammad Bilal Zafar, Berlin, DE;
Pedro L Larroy, Redwood City, CA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Views may be generated for bias metrics or feature attribution captured in machine learning pipelines. A request to create a view of bias metrics or feature attribution may be received. The bias metrics or feature attribution may have been determined in a machine learning pipeline as part of executing a training job that specified the bias metrics or the feature attribution. A development application may access a data store that stores the bias metrics or the feature attribution determined in the machine learning pipeline. A view based on the bias metrics or feature attribution may be generated and provided.