The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Aug. 03, 2023
Applicant:

The Toronto-dominion Bank, Toronto, CA;

Inventors:

Tyler Austin Neil, Ottawa, CA;

Kathleen Bell, Ottawa, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2025.01); G06F 11/07 (2006.01); G06F 11/3668 (2025.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 11/0751 (2013.01); G06F 11/0793 (2013.01); G06F 11/3668 (2013.01); G06F 11/3684 (2013.01); G06F 11/0709 (2013.01);
Abstract

A system comprises at least one processor; and a memory coupled to the at least one processor, the memory storing processor-executable instructions that, when executed, configure the at least one processor to receive a request to create a data corruption detection test; generate a set of operations to create the data corruption detection test, at least one of the operations including a request to generate error-identification processor-executable instructions; conduct an automated review of the data corruption detection test to confirm that the set of operations to create the data corruption detection test are complete; and implement the data corruption detection test to determine whether one or more functions performed according to processor-executable instructions of a function-performing module were performed according to a defined rule.


Find Patent Forward Citations

Neil, Tyler. (2026). Method and system for implementing a data corruption detection test (U.S. Patent No. 12554699). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12554699

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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