The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Mar. 12, 2025
Applicant:

Citibank, N.a., New York, NY (US);

Inventors:

Raja Shekher Kammara, Chennai, IN;

Jose Javier Castanon De La Vega, Irving, TX (US);

Pranita Santosh Patil, Irving, TX (US);

Ravi Padarthi, Irving, TX (US);

Richard Eric Lawton, Irving, TX (US);

Assignee:

CITIBANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/11 (2019.01); G06F 16/182 (2019.01);
U.S. Cl.
CPC ...
G06F 16/11 (2019.01); G06F 16/182 (2019.01);
Abstract

Systems and methods are disclosed comprising instructions to receive a snapshot of data artifacts corresponding to a user of a plurality of runtime applications prior to upload at a remote database, access an assigned set of constraint parameters that defines acceptable content elements of data artifacts, determine a first set of non-compliant content elements of each data artifact that fail to satisfy a first subset of the set of constraint parameters, determine a second set of non-compliant content elements of each data artifact that fail to satisfy a second subset of the set of constraint parameters, generate a content sensitivity score indicating management risk for each data artifact, identify a set of critical data artifacts corresponding to content sensitivity scores that fail to satisfy a risk tolerance threshold, and transmit a notification alert to the user indicating content review of at least one identified critical data artifact from the snapshot.


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