The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Nov. 13, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Huijuan Fan, Chengdu, CN;

Changxu Jiang, Chengdu, CN;

Bob Biao Yan, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01);
Abstract

Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting, by a test selection system, a regression test case from a plurality of regression test cases in a software testing lifecycle system. The test selection system calculates a fault detection score for the regression test case, based on a fault detection decay rate score associated with the regression test case. The test selection system selects the regression test case for execution on a test system based on the fault detection score, and executes the regression test case on the test system.


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