The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Apr. 03, 2023
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Reid Allen Pryzant, Seattle, WA (US);
Yin Tat Lee, Seattle, WA (US);
Chenguang Zhu, Issaquah, WA (US);
Sebastien Bubeck, Seattle, WA (US);
Ronen Eldan, Seattle, WA (US);
Yuwei Fang, Redmond, WA (US);
Dan Iter, Cedar Park, TX (US);
Yichong Xu, Bellevue, WA (US);
Yuanzhi Li, Monroe, WA (US);
Yi Zhang, Seattle, WA (US);
Lijuan Qin, Redmond, WA (US);
Nanshan Zeng, Bellevue, WA (US);
Xuedong Huang, Yarrow Point, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Systems and methods are provided for implementing quality assurance for digital technologies using language model ('LM')-based artificial intelligence (“AI”) and/or machine learning (“ML”) systems. In various embodiments, a first prompt is provided to an LM actor or attacker to cause the LM actor or attacker to generate interaction content for interacting with test software. Responses from the test software are then evaluated by an LM evaluator to produce evaluation results. In some examples, a second prompt is generated that includes the responses from the test software along with the evaluation criteria for the test software. When the second prompt is provided to the LM evaluator, the LM evaluator generates the evaluation results.