The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Nov. 22, 2022
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Viraj Srivastava, New Delhi, IN;

Praveen Tayal, Hyderabad, IN;

Puneet Sharma, Bangalore, IN;

Lingathurai Palanisamy, Bangalore, IN;

Minal Nitin Dani, Bangalore, IN;

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/54 (2006.01); G06F 18/241 (2023.01);
U.S. Cl.
CPC ...
G06F 9/542 (2013.01); G06F 18/241 (2023.01);
Abstract

Various embodiments described herein relate to classification of events by pattern recognition in multivariate time series data associated with one or more assets. In this regard, a request to classify events associated with one or more assets is received. The request includes an asset descriptor describing the one or more assets. In response to the request, aggregated multivariate data associated with the one or more assets is obtained based on the asset descriptor. Furthermore, one or more events associated with the aggregated multivariate data is labeled based respective defined data signatures for respective defined events associated with a defined event attribute. A dashboard visualization is then provided to an electronic interface of a computing device. The dashboard visualization includes data associated with the one or more events.


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