The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
May. 19, 2023
Applicant:
Adeia Imaging Llc, San Jose, CA (US);
Inventor:
Tao Chen, Palo Alto, CA (US);
Assignee:
Adeia Imaging LLC, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/04845 (2022.01); G06F 3/04817 (2022.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06F 3/04845 (2013.01); G06F 3/04817 (2013.01); G06T 5/50 (2013.01); G06T 2207/20221 (2013.01);
Abstract
Systems and methods are provided for improving image item editing. An image item is selected at a computing device and with an editing application, and a preferred editing option to apply to the image item is identified via a user profile. The preferred editing option is determined based on historic editing actions for a plurality of different image items. An icon for applying the preferred editing option to the image item is generated for display in a user interface of the editing application. User input associated with the icon is received, and the preferred editing option is applied to the image item.