The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Oct. 20, 2023
Applicant:
Viewray Systems, Inc., Denver, CO (US);
Inventors:
James F. Dempsey, Pebble Beach, CA (US);
Iwan Kawrykow, Sofia, BG;
Assignee:
ViewRay Systems, Inc., Denver, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); A61B 5/055 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); A61B 5/055 (2013.01); G01R 33/5602 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 2207/10088 (2013.01); G06T 2207/30008 (2013.01);
Abstract
Disclosed are systems, computer software, and methods for generating a relative electron density map (RED) from a magnetic resonance imaging (MRI) scan. This can include obtaining an MRI scan of a portion of a patient and segmenting a first region and a second region in the MRI scan. A RED map can then be generated from the MRI scan by assigning a first RED to the first region, assigning a second RED to the second region, and assigning REDs to unsegmented regions in the MRI scan based on intensities in the MRI scan.