The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Apr. 24, 2023
Applicant:

Vanderbilt University, Nashville, TN (US);

Inventors:

Piran R. Kidambi, Nashville, TN (US);

Nicole Moehring, Nashville, TN (US);

Pavan Chaturvedi, Nashville, TN (US);

Assignee:

Vanderbilt University, Nashville, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/333 (2006.01); G01N 27/20 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3335 (2013.01); G01N 27/20 (2013.01);
Abstract

Disclosed herein are methods of characterizing two-dimensional materials, devices comprising said materials and methods of making and use thereof. For example, disclosed herein are methods for characterizing pore(s) and/or defect(s) in a two-dimensional (2D) material, comprising: performing electrically driven ionic transport measurements on a K-form membrane using a first liquid electrolyte comprising KCl to determine the Kconductance of the K-form membrane; subsequently converting the K-form membrane to a H-form membrane; and performing electrically driven ionic transport measurements on the H-form membrane using a second liquid electrolyte comprising HCl to determine the Hconductance of the H-form membrane; and analyzing the Kconductance of the K-form membrane and the Hconductance of the H-form membrane to determine a property of the two-dimensional material, wherein the property relates to a characteristic of the pore(s) and/or defect(s) in the two-dimensional material.


Find Patent Forward Citations

Quick Actions:

Kidambi, Piran. (2026). Methods of characterizing two-dimensional materials, devices comprising said materials and methods of making and use thereof (U.S. Patent No. 12553853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553853

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…