The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

May. 04, 2023
Applicant:

Analog Devices International Unlimited Company, Limerick, IE;

Inventors:

Youri Victorovitch Ponomarev, Rotselaar, BE;

Helen Berney, Pennywell, IE;

Junfei Xia, Andover, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3275 (2013.01);
Abstract

Methods and systems for determining a property of an analyte in a sample, wherein a field is applied to a sensing surface to cause an analyte to debind from a surface, and subsequently the field is modified or removed to allow the analyte to rebind.


Find Patent Forward Citations

Ponomarev, Youri. (2026). System and method for determining a property of an analyte (U.S. Patent No. 12553849). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553849

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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