The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Nov. 12, 2024
Applicant:

The Boeing Company, Arlington, VA (US);

Inventor:

Morteza Safai, Newcastle, WA (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20008 (2018.01); G01N 23/203 (2006.01); H01J 35/14 (2006.01);
U.S. Cl.
CPC ...
G01N 23/203 (2013.01); G01N 23/20008 (2013.01); H01J 35/153 (2019.05); G01N 2223/053 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/204 (2013.01); G01N 2223/316 (2013.01); G01N 2223/3301 (2013.01); G01N 2223/5015 (2013.01); G01N 2223/503 (2013.01); G01N 2223/645 (2013.01); G01N 2223/646 (2013.01);
Abstract

Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus includes an x-ray source and an x-ray collimator. The x-ray collimator includes a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further includes an x-ray intensity sensor that is fixed to the x-ray collimator over the detection aperture such that at least a portion of an uncollimated x-ray emission, collimated into the detection aperture, is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally includes an emission alignment adjuster that is operable to adjust a position of the uncollimated x-ray emission relative to the plurality of emission apertures and the detection aperture in response to the at least the portion of the uncollimated x-ray emission detected by the x-ray intensity sensor.


Find Patent Forward Citations

Safai, Morteza. (2026). System, method, and apparatus for x-ray backscatter inspection of parts (U.S. Patent No. 12553839). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553839

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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