The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Jan. 24, 2024
Applicant:
Sun Chemical Corporation, Parsippany, NJ (US);
Inventors:
Carl Weisbecker, Carlstadt, NJ (US);
Mohammad S. Farahat, Carlstadt, NJ (US);
Erika Rebrosova, St. Charles, IL (US);
Srikanth Yanamanagandla, Carlstadt, NJ (US);
Assignee:
Sun Chemical Corporation, Parsippany, NJ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); B41M 3/06 (2006.01); C09D 11/50 (2014.01); C09D 11/52 (2014.01); G01N 21/88 (2006.01); G01N 21/956 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); B41M 3/06 (2013.01); C09D 11/50 (2013.01); C09D 11/52 (2013.01); G01N 21/8851 (2013.01); G01N 21/956 (2013.01); G01N 2021/6471 (2013.01); G01N 2201/061 (2013.01); G02B 21/16 (2013.01);
Abstract
The present application discloses a method for optical detection of defects on a photosensitive object by fluorescence imaging in the infrared and near-infrared wavelengths of light. The method of fluorescence imaging enables fast and efficient defect detection on the object for quality control. Furthermore, the imaging process does not alter, discolor, or degrade electrical performance of the photosensitive object.