The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Feb. 29, 2024
Applicant:

Nanohmics, Inc., Austin, TX (US);

Inventors:

Mark E. Lucente, Austin, TX (US);

John Bruno, Kyle, TX (US);

Andrew Foley, Austin, TX (US);

Assignee:

Nanohmics, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/23 (2006.01); G01N 21/01 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/23 (2013.01); G01N 21/21 (2013.01); G01N 2021/0181 (2013.01); G01N 2021/216 (2013.01);
Abstract

A method and system for determining the presence of a selected analyte in a sample include an all-dielectric, metasurface sensor having one or more arrays of subwavelength-scale, dielectric nanopillars having anisotropic cross-sections. Nanopillars in selected regions of the metasurface sensor may be functionalized with binders for selectively binding the selected analyte. Methods for detecting the selected analyte in a sample rely on exposing the sensor to a test sample, probing the sensor with probe light having a selected polarization state, and comparing the polarization state of output light reflected or transmitted by functionalized regions of the sensor with a baseline polarization state of output light determined with a sample lacking the selected analyte.


Find Patent Forward Citations

Lucente, Mark. (2026). System and method for analyte detection (U.S. Patent No. 12553822). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553822

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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