The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Jan. 31, 2022
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Kazuki Horita, Hamamatsu, JP;

Kouichiro Akiyama, Hamamatsu, JP;

Yoichi Kawada, Hamamatsu, JP;

Hiroshi Satozono, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/04 (2006.01); G01N 1/44 (2006.01); G01N 15/00 (2024.01); G01N 21/3577 (2014.01);
U.S. Cl.
CPC ...
G01N 15/042 (2013.01); G01N 1/44 (2013.01); G01N 21/3577 (2013.01); G01N 2015/0053 (2013.01); G01N 2015/045 (2013.01);
Abstract

An ATR apparatus includes a prism having a reflection surface, a holding unit holding a sample including a suspension on the reflection surface, and an adjustment unit adjusting a fluidal state of the sample held on the reflection surface. The adjustment unit adjusts the fluidal state of the sample to a first fluidal state in order to acquire a first detection result relating to the sample in the first fluidal state and adjusts the fluidal state of the sample to a second fluidal state in order to acquire a second detection result relating to the sample in the second fluidal state.


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