The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Dec. 14, 2022
Applicant:

The Government of the United States, As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Todd H. Stievater, Arlington, VA (US);

Nathan Tyndall, Alexandria, VA (US);

Marcel W. Pruessner, Chevy Chase, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/331 (2013.01); G01M 11/333 (2013.01); G01M 11/335 (2013.01);
Abstract

A method and system for obtaining photonic parameters. The system includes a computer, an optical source, a first and second optical fiber, a Mach-Zehnder Interferometer (MZI) structure, and a detector. The computer includes a processor and memory. The optical source is constructed to emit light of a first optical mode and a second optical mode in response to an instruction by the computer. The first optical fiber receives the first or second optical mode. The MZI structure includes first and second pluralities MZIs and receives the first or second optical mode from the optical fiber. The second optical fiber receives light from the MZI structure. The detector is configured to receive light that propagated through the second optical fiber, generate image data and provide the image data to the computer. The computer obtains a plurality of photonic parameters based on the image data and initial guesses for the plurality of photonic parameters.


Find Patent Forward Citations

Stievater, Todd. (2026). Methods and apparatuses for optical and geometric parameter extraction for photonic integrated circuits (U.S. Patent No. 12553792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553792

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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