The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Apr. 21, 2023
Ifm Electronic Gmbh, Essen, DE;
Lorenz Halbinger, Kißlegg, DE;
IFM Electronic GmbH, Essen, DE;
Abstract
A method for recognizing deposits and/or adhesions on the outside of a measurement membrane of a pressure measuring device within a process facility is disclosed. The pressure measuring device includes a pressure measuring cell comprising a measurement membrane to detect pressure of a medium in a container. The outside of the measurement membrane is at least partially in contact with the medium its second side facing away from the medium includes means for detecting deflection of the measurement membrane. The pressure measuring device detects a micropulsation superimposed on the static pressure as an actual value. Micropulsations result from specific operating states of the process facility. Micropulsation conditions typical of specific operating states have been stored beforehand as setpoint values in an equalization procedure. The detected actual values are compared to the specified setpoint values, and an alarm signal is generated if they exceed and/or fall below the specified values.