The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Dec. 19, 2022
Applicant:

Nextnav, Llc, Sunnyvale, CA (US);

Inventors:

Michael Dormody, San Jose, CA (US);

Guiyuan Han, San Jose, CA (US);

Badrinath Nagarajan, Cupertino, CA (US);

Assignee:

NextNav, LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 5/00 (2006.01); G01L 27/00 (2006.01); G01S 5/00 (2006.01); G06F 17/18 (2006.01); H04W 4/029 (2018.01);
U.S. Cl.
CPC ...
G01C 5/00 (2013.01); G01L 27/002 (2013.01); G01S 5/01 (2020.05); G06F 17/18 (2013.01); H04W 4/029 (2018.02);
Abstract

Determining when an estimated altitude of a mobile device can be used for calibration or location determination. Particular systems and methods determine an area in which the mobile device is expected to reside, determine an altitude value of each section of a plurality of sections in the area, determine if the altitude values meet a threshold condition, and determine that the estimated altitude of the mobile device can be used for determining the position of the mobile device or for calibrating a pressure sensor of the mobile device when the altitude values meet the threshold condition.


Find Patent Forward Citations

Dormody, Michael. (2026). Systems and methods for determining when an estimated altitude of a mobile device can be used for calibration or location determination (U.S. Patent No. 12553716). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12553716

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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