The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Jun. 27, 2023
Leica Geosystems Ag, Heerbrugg, CH;
Markus Steiner, Gränichen, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A method for optimizing simultaneous use of a multitude of coordinate measuring devices at a multitude of locations, comprising: obtaining job information about a multitude of coordinate measuring jobs at the multitude of locations, the job information comprising the position of one or more objects, a time for performing the job, required capabilities of involved devices, and required certifications and/or calibrations for the involved devices; determining an actual position and a condition of each device, the condition comprising a measuring precision and a measuring speed, individual conditions of a plurality of components of the device, a maintenance status and a certification and/or calibration status; performing a job analysis involving the obtained job information and the determined positions and conditions; and performing, based on a result of the analysis, an assignment optimization for assigning at least a subset of the devices to the jobs.