The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

May. 31, 2022
Applicant:

Nsk Ltd., Tokyo, JP;

Inventors:

Kakeru Enami, Fujisawa, JP;

Hiroki Yamada, Fujisawa, JP;

Hideyuki Uyama, Fujisawa, JP;

Assignee:

NSK Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F16C 19/52 (2006.01); G01F 22/02 (2006.01); G01M 13/04 (2019.01); G01N 17/00 (2006.01); G01N 33/2025 (2019.01);
U.S. Cl.
CPC ...
F16C 19/52 (2013.01); G01F 22/02 (2013.01); G01M 13/04 (2013.01); G01N 17/002 (2013.01); G01N 17/006 (2013.01); G01N 33/2025 (2019.01);
Abstract

An object is to provide an evaluation method for detecting the amount of hydrogen supposed to influence white structure flaking in a simple manner in a short period of time and evaluating possibility of white structure flaking from the detected hydrogen amount. The provided is a possibility evaluation method of white structure flaking that, by measuring an amount of hydrogen gas generated under a condition simulating a use condition of a rolling device used in industrial equipment and existing in an atmosphere, evaluates possibility of white structure flaking in the rolling device.


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