The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Mar. 07, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tiberiu Suto, Franklin, NY (US);

Jessica Nahulan, Markham, CA;

Jeremy R. Fox, Georgetown, TX (US);

Carolina Garcia Delgado, Zapopan, MX;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 64/118 (2017.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/118 (2017.08); B33Y 50/02 (2014.12);
Abstract

Provided is a method of autonomous filament selection for multidimensional printers. The method includes obtaining multimedia associated with multidimensional prints and constituent filaments. The obtained multimedia is analyzed to extract multidimensional print features, filament features, and user feedback for at least some of the multidimensional prints and at least some of the constituent filaments. The extracted multidimensional print features, filament features, and user feedback are mapped. At least one filament is selected for a new multidimensional print based on a plurality of user desired multidimensional print features.


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