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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12551314 B1

PDFFull Text
Date of Patent:
Feb. 17, 2026

Filed:

Mar. 09, 2021

Examination marker

Applicant:

Toppan Printing Co., Ltd., Tokyo, JP;

Inventors:

Junya Tanabe, Tokyo, JP;

Ryohei Tode, Tokyo, JP;

Saeko Nomura, Tokyo, JP;

Tsukasa Yamazaki, Tokyo, JP;

Ryo Shoda, Tokyo, JP;

Hiroyoshi Nishiyama, Tokyo, JP;

Assignee:

TOPPAN PRINTING CO., LTD., Tokyo, JP;

Attorney:

Foley & Lardner LLP

Primary Examiner:

Michael J Carey

Assistant Examiner:

Marjan undefined Saboktakin

Int. Cl.
CPC ...
A61B 90/00 (2016.01); A61B 5/00 (2006.01); A61B 5/0507 (2021.01); C09J 7/20 (2018.01); C09J 7/25 (2018.01); C09J 7/29 (2018.01); C09J 7/30 (2018.01); C09J 7/38 (2018.01);
U.S. Cl.
CPC ...
A61B 90/39 (2016.02); A61B 5/004 (2013.01); A61B 5/0507 (2013.01); A61B 5/4312 (2013.01); C09J 7/20 (2018.01); C09J 7/255 (2018.01); C09J 7/29 (2018.01); C09J 7/30 (2018.01); C09J 7/38 (2018.01); A61B 2090/3908 (2016.02); A61B 2090/397 (2016.02); A61B 2090/3991 (2016.02); C09J 2203/334 (2013.01); C09J 2301/312 (2020.08); C09J 2467/006 (2013.01); C09J 2475/006 (2013.01);
Abstract

An examination marker is used in diagnostic imaging using microwaves, including a marker body to be adhered to a site to be examined. The marker body is configured to display an index used for scanning of the site to be examined and to deform in accordance with a shape of the site to be examined, and the marker body has a transmittance of 70% or higher to microwaves at a frequency of 2 GHz.

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Tanabe, Junya. (2026). Examination marker (U.S. Patent No. 12551314). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12551314

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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