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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12551101 B1

PDFFull Text
Date of Patent:
Feb. 17, 2026

Filed:

Jun. 10, 2022

System and method for digital measurements of subjects

Applicant:

Eyesmatch Ltd., Tortola, VG;

Inventors:

Ofer Saban, Vienna, VA (US);

Nissi Vilcovsky, Tokyo, JP;

Assignee:

EyesMatch Ltd., Tortola, VG;

Attorneys:

Vorys, Sater, Seymour and Pease LLP

Khaled Shami

Primary Examiner:

Michael J Vanchy, Jr

Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 3/024 (2006.01); A61B 3/032 (2006.01); A61B 3/113 (2006.01); G06F 3/01 (2006.01); G06T 7/70 (2017.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
A61B 3/113 (2013.01); A61B 3/024 (2013.01); A61B 3/032 (2013.01); G06F 3/013 (2013.01); G06T 7/70 (2017.01); G06T 7/97 (2017.01); G06V 40/162 (2022.01); G06T 2207/10016 (2013.01);
Abstract

A method for performing digital measurements by obtaining a first video stream of a user at a first distance to a camera; using an element appearing in the first video stream to generate a transformation factor to convert pixel distance in the first video stream to actual physical distance in the real world; using the transformation factor to obtain a first digital measurement in the first video stream; obtaining a second video stream at a second distance, larger than the first distance; using the first digital measurement and an angular measurement to an item appearing in the second video stream to determine a measurement of the second distance.

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Saban, Ofer. (2026). System and method for digital measurements of subjects (U.S. Patent No. 12551101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12551101

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