The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Nov. 01, 2021
Applicant:

Farmers Edge Inc., Winnipeg, CA;

Inventors:

Cecilia M. Tojo Soler, Winnipeg, CA;

Summer Xia, Winnipeg, CA;

Eduardo Gelcer, Winnipeg, CA;

Assignee:

Farmers Edge Inc., Winnipeg, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01B 79/00 (2006.01); G01W 1/02 (2006.01); G01W 1/14 (2006.01); G06T 7/00 (2017.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
A01B 79/005 (2013.01); G01W 1/02 (2013.01); G01W 1/14 (2013.01); G06T 7/0016 (2013.01); G06V 20/188 (2022.01); G06T 2207/30188 (2013.01);
Abstract

A method of managing crop stress related to a crop growing within an agricultural field uses a cropping systems model executed on the computing device to simulate growth of the crop. At least one stress index representative of a crop stress affecting growth of the crop is calculated based upon acquired field centric data and one or more of stress thresholds associated with a determined growth stage of the crop to determine if a notification should be generated. This provides a tool to detect and quantify crops abiotic and biotic stresses at zone and field levels in actual time during the growing season using crop specific parameters, field data and remotely-sensed data, aiming to provide growers with useful information to mitigate crops stresses and increase yield.


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