The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jan. 31, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Abhijit Bhattacharya, Bangalore, IN;

Sudheer Manjunath Poojary, Bengaluru, IN;

Akshay Kumar Bajpai, Bangalore, IN;

Manikandan Chandrasekar, Bangalore, IN;

Raj Kumar Krishna Kumar, Bangalore, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/08 (2024.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01); H04W 74/0833 (2024.01);
U.S. Cl.
CPC ...
H04W 74/085 (2013.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01);
Abstract

This disclosure provides methods, devices and systems for clear channel assessment (CCA) for wireless communications in wireless local area networks (WLANs). In some aspects, an access point (AP) may detect an interfering transmission associated with an overlapping basic service set (OBSS). The AP may further transmit, to at least one station (STA), a probe frame soliciting information indicating an interference environment observed by the at least one STA when an interfering transmission fails to satisfy an interference criterion associated with the AP. The AP may further transmit the probe frame to the at least one STA after a backoff period when the interfering transmission satisfies the interference criterion associated with the AP.


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