The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Sep. 25, 2020
Samsung Electronics Co., Ltd., Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
The embodiment of the present disclosure provides a method for reporting and configuring MDT measurement, apparatus and electronic device using the same and medium. The method may be performed by a first access network node and includes: obtaining first MDT configuration information; performing MDT measurement according to the first MDT configuration information to obtain a first MDT measurement report; transmitting the first MDT measurement report to a first node, so that the first node combines a second MDT measurement report associated with the first MDT measurement report obtained by the first node with the first MDT measurement report; and/or receiving a third MDT measurement report transmitted by a second access network node, combining the third MDT measurement report and the first MDT measurement report, and transmitting the combined measurement report to a second node. The solution provided in the embodiment of the present disclosure provides an implementation method of reporting MDT measurement when performing MDT measurement at multiple nodes.