The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Aug. 05, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Qiming Li, Cupertino, CA (US);

Dawei Zhang, Beijing, CN;

Huaning Niu, Cupertino, CA (US);

Jie Cui, Cupertino, CA (US);

Manasa Raghavan, Cupertino, CA (US);

Xiang Chen, Cupertino, CA (US);

Yang Tang, Cupertino, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01);
Abstract

Methods and systems are disclosed for a UE to perform measurements of measurement resources transmitted by a network when the UE is configured with multiple concurrent measurement gap patterns (MGPs). The measurement resources may be carried on multiple carrier frequencies. The UE may receive measurement resource configuration parameters identifying time and frequency locations of the measurement resources transmitted on the multiple carrier frequencies. The UE may receive measurement gap configuration parameters for multiple concurrent MGPs specifying measurement intervals that may be used to perform the measurements. The UE may determine a linkage between the measurement resources on a carrier frequency and one of the concurrent MGPs so that the UE may independently measure the measurement resources received on the multiple carrier frequencies using their respectively linked MGPs. The linkage may be made through information elements in the measurement resource configuration parameters or the measurement gap configuration parameters containing the MGP.


Find Patent Forward Citations

Li, Qiming. (2026). Methods for rrm measurements when ue is configured with multiple concurrent measurement gap patterns (U.S. Patent No. 12549973). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12549973

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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