The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jul. 31, 2023
Applicants:

General Electric Company, Schenectady, NY (US);

Oliver Crispin Robotics Limited, Altrincham, GB;

Inventors:

Younkoo Jeong, Clifton Park, NY (US);

Ambarish J. Kulkarni, Glenville, NY (US);

Vamshi Krishna Reddy Kommareddy, Bangalore, IN;

Jonathan R. Hootman, West Chester, OH (US);

Jean-Philippe Choinière, Orford, CA;

Marc-André Blouin, Ste-Catherine, CA;

Andrew Crispin Graham, Badminton, GB;

Byron Andrew Pritchard, Loveland, OH (US);

Assignees:

General Electric Company, Evendale, OH (US);

Oliver Crispin Robotics Limited, Altrincham, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 23/74 (2023.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
H04N 23/74 (2023.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01); H04N 23/90 (2023.01);
Abstract

An inspection system is provided. The inspection system includes a light source and a surface profile compensator. The light source illuminates a contoured surface of a part. The surface profile compensator causes light emitted from the light source to be distributed over an inspection area of the contoured surface according to a target light distribution.


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