The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Jun. 21, 2023
Applicant:
Innowireless Co., Ltd., Seongnam-si, KR;
Inventors:
Young Su Kwak, Suwon-si, KR;
Yong Hoon Lim, Seoul, KR;
Il Doo Chang, Anyang-si, KR;
Jong Pil Seo, Incheon, KR;
Assignee:
INNOWIRELESS CO., LTD., Seongnam-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/11 (2015.01); G01R 29/08 (2006.01); G01R 29/10 (2006.01); H04B 17/309 (2015.01);
U.S. Cl.
CPC ...
H04B 17/11 (2015.01); G01R 29/0892 (2013.01); G01R 29/10 (2013.01); H04B 17/309 (2015.01);
Abstract
A method and an apparatus for calibrating an array path of a beam forming test equipment for a base station, includes enabling a beam forming-related interlocking test of a base station and a test equipment by compensating for distortion of the beam forming characteristics of the base station incidentally caused by the connection between the base station and the test equipment by using a specific signal transmitted from the base station, when test equipment such as a channel simulator is used to test beam forming of a base station.