The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Nov. 25, 2024
Applicant:

Eaton Intelligent Power Limited, Dublin, IE;

Inventors:

Arpit Agrawal, Pune, IN;

Praveen Kumar Singh, Pimpri-Chinchwad, IN;

Uday Prakashrao Mhaskar, Pune, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 3/44 (2006.01); H02J 3/38 (2006.01); H02J 3/388 (2026.01);
U.S. Cl.
CPC ...
H02J 3/44 (2013.01); H02J 3/388 (2020.01); H02J 2203/10 (2020.01);
Abstract

Software-based source voltage parameter monitoring is provided for load centers that include one or more DERs. The software enables a system energy manager (SEM) controller to monitor the relevant source voltage parameters of each DER and other voltage sources to ensure that each DER meets applicable safety standards when connecting to and disconnecting from the utility grid. The software eliminates the need to install off-the-shelf (OTS) chips in hardware used within a load center to communicate the source voltage parameters of each voltage source to the SEM controller. Instead, the software enables an SEM controller to detect the voltage signal output by each voltage source in a load center, and uses a dynamically generated internal control signal that is transformed to a rotating reference frame to detect the RMS voltage, phase angle, and frequency of each voltage source output. Eliminating OTS chips eliminates communication latency and increases system reliability.


Find Patent Forward Citations

Agrawal, Arpit. (2026). Modular and scalable technique for measurement of der/source parameters for multi-phase and multi-source system for ise and metering applications (U.S. Patent No. 12549014). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12549014

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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