The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jan. 24, 2024
Applicants:

Denso Corporation, Kariya, JP;

National University Corporation Tokai National Higher Education and Research System, Nagoya, JP;

Inventors:

Takahisa Yamamoto, Nagoya, JP;

Tomoharu Tokunaga, Nagoya, JP;

Ryota Kono, Nagoya, JP;

Kouhei Hieda, Nagoya, JP;

Yasuyuki Hikita, Kariya, JP;

Kazuhiko Kano, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01B 1/08 (2006.01); B05D 5/12 (2006.01); H01B 13/00 (2006.01);
U.S. Cl.
CPC ...
H01B 1/08 (2013.01); B05D 5/12 (2013.01); H01B 13/003 (2013.01);
Abstract

A conductive film includes a metal oxide as a main component. The metal oxide contains the same components as components of a compound represented by a formula (I):(AO)BO  (I)where A in the formula (I) is a metal element capable of having a valence of +1 or +2, B in the formula (I) is a transition metal element capable of having a valence of +4 or +5, O in the formula (I) is an oxygen element, and an average valence of B in the formula (I) is less than the maximum oxidation number of B. The metal oxide has a crystal structure in which diffraction peaks in an X-ray diffraction pattern of the metal oxide appear at same diffraction angles as diffraction angles at which diffraction peaks in an X-ray diffraction pattern of the compound represented by the formula (I) appear.


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