The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Feb. 04, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Atsushi Goto, Kanagawa, JP;

Shigeru Toriihara, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G06V 10/22 (2022.01); G06V 10/70 (2022.01);
U.S. Cl.
CPC ...
G06V 20/693 (2022.01); G06V 10/22 (2022.01); G06V 10/70 (2022.01);
Abstract

An image processing apparatus supports observation of an object using a microscope. The image processing apparatus includes an obtainment unit and specifying unit. The obtainment unit obtains an image captured from an object observed by using a microscope. The specifying unit specifies at least one area in the image that will be captured at an expanded magnification based on evaluation of a detection target included in the image and a magnification of the microscope in capturing the image.


Find Patent Forward Citations

Goto, Atsushi. (2026). Image processing apparatus supporting observation of object using microscope, control method therefor, and storage medium storing control program therefor (U.S. Patent No. 12548353). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12548353

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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