The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jul. 21, 2023
Applicant:

Shenzhen University, Guangdong, CN;

Inventors:

Hui Huang, Shenzhen, CN;

Yilin Liu, Shenzhen, CN;

Assignee:

SHENZHEN UNIVERSITY, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06V 10/46 (2022.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/46 (2022.01); G06V 10/806 (2022.01); G06V 10/82 (2022.01);
Abstract

Disclosed are a method for predicting reconstructability, a computer device, and a storage medium. In the method, a plurality of viewpoints to be evaluated for a target sampling point are obtained. The target sampling point is located on a rough geometric model. A spatial characteristic of the target sampling point is obtained based on spatial relationships between the plurality of viewpoints to be evaluated and the target sampling point. An image characteristic of the target sampling point is extracted from a target captured image based on a plurality of pre-acquisition viewpoints. The pre-acquisition viewpoints are obtained based on poses of a camera capturing the target captured image. The target captured image is an image containing the target sampling point. The predicting reconstructability for the target sample point is predicted based on the image characteristic and the spatial characteristic.


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