The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Jan. 25, 2024
Industrial Technology Research Institute, Hsinchu, TW;
Wei-Shiang Huang, Tainan, TW;
Chih-Kai Chiu, Tainan, TW;
Yong-Sin Syu, Kaohsiung, TW;
Jhe-Ruei Li, Tainan, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A three-dimensional imaging method includes: projecting structured light pattern on a reference plane and capturing a reference plane image of the reference plane to obtain a reference phase; projecting structured light pattern on a workpiece surface and capturing a workpiece surface image set of the workpiece surface to obtain a workpiece phase; obtaining a workpiece phase difference based on the difference between the reference phase and the workpiece phase; performing temporal binarization encoding on the workpiece surface image set to generate a coded image; detecting noise areas in the coded image; integrating the noise areas to establish a noise phase mask; filtering noises in the coded image according to the noise phase mask to generate a noise-filtered phase; compensating for the noise-filtered phase to restore the workpiece phase difference; and performing three-dimensional reconstructing on the restored workpiece phase difference to form a 3D point cloud of the workpiece surface.