The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jul. 18, 2023
Applicants:

University of Connecticut, Farmington, CT (US);

Aerocyonics Imaging, Llc, Stamford, CT (US);

Inventors:

Hongbin Choi, Farmington, CT (US);

Nicholas May, Farmington, CT (US);

Adrian Phoulady, Farmington, CT (US);

Sina Shahbazmohamadi, Farmington, CT (US);

Pouya Tavousi, Farmington, CT (US);

Daniel Dimase, East Greenwich, RI (US);

Assignees:

University of Connecticut, Farmington, CT (US);

Aerocyonics Imaging, LLC, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); G01N 1/286 (2013.01);
Abstract

A system and method for generating a three-dimensional image of a sample. The system comprises a platform configured to support the sample, a laser source configured to output a laser beam to remove material from the sample, a microscope imaging system, and a controller communicatively coupled to the laser source and the microscope imaging system. The controller is configured to (a) acquire height data of a surface of the sample with the microscope imaging system, (b) generate a mask based on the height data of the surface of the sample, the mask providing a laser cutting pattern for the sample, (c) acquire an image and a height map of the surface of the sample with the microscope imaging system, (d) activate the laser source to generate a laser beam to delayer the sample based on the mask, and repeat steps (a)-(d) to generate a three-dimensional image of the sample.


Find Patent Forward Citations

Choi, Hongbin. (2026). System and method for high-resolution 3d images using laser ablation and microscopy (U.S. Patent No. 12548219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12548219

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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