The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Feb. 28, 2024
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Hiroyuki Fujita, Osaka, JP;

Yosuke Shiota, Osaka, JP;

Yamato Uehara, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06T 7/0004 (2013.01); G06T 2207/30164 (2013.01); G06T 2210/52 (2013.01);
Abstract

To speed up an entire inspection by preventing display processing from delaying execution of inspection processing. An image inspection system includes an imaging unit, a first control unit configured to generate a setting screen on which a formula setting of an imaging parameter of the imaging unit, a formula setting of an inspection parameter of a workpiece image, and a display setting of an inspection result can be set in a cell of a worksheet, and display the inspection result on a display unit according to the display setting set in the cell of the worksheet, and a second control unit configured to cause the imaging unit to execute imaging processing, execute inspection processing on the workpiece image, and execute a formula calculation related to the imaging parameter and the inspection parameter set in the worksheet.


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