The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Mar. 12, 2024
Applicant:

Pramana, Inc., Cambridge, MA (US);

Inventors:

Durgaprasad Dodle, Telangana, IN;

Shilpa G. Krishna, Kerala, IN;

Priyanka Golchha, Rajasthan, IN;

Raghubansh Bahadur Gupta, Bangalore, IN;

Jaya Jain, Shahpura, IN;

Prasanth Perugupalli, Cary, NC (US);

Prateek Jain, Karnataka, IN;

Parveen Shaik Gangirevula, Bengaluru, IN;

Pavani Pallavi Pelluru, Pocharam, IN;

Assignee:

Pramana, Inc., Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Described herein is a system for digitizing a slide. A system may include an optical system including at least an optical sensor; and a computing device configured to perform a scan of the slide by capturing at least a first image and capturing at least a second image, wherein performing the scan includes identifying a first scanning parameter; using the optical system, capturing the at least a first image as a function of the first scanning parameter; determining a first quality metric as a function of the at least a first image; determining a second scanning parameter as a function of the first quality metric; and using the optical system, capturing the at least a second image as a function of the second scanning parameter.


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