The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Jul. 11, 2023
Canon Kabushiki Kaisha, Tokyo, JP;
Yuki Daiku, Chiba, JP;
Masashi Oya, Saitama, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
The present invention provides an inspection apparatus operable to read an image formed on a printing medium by a printing apparatus and inspect the read image. The inspection apparatus stores image data used at the time of forming the image on a printing medium as a reference image, obtains image data of an image of a printing medium on which the reference image has been formed as a inspection target image and determines whether contents of the inspection target image and contents of the reference image coincide. The inspection apparatus aligns the inspection target image and the reference image according to a result of the determination; and detects a defect in the inspection target image by comparing the aligned inspection target image and reference image.