The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Nov. 27, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Sanjiv Das, San Jose, CA (US);
Michele Donini, Berlin, DE;
Jason Lawrence Gelman, Los Altos, CA (US);
Kevin Haas, Los Gatos, CA (US);
Tyler Stephen Hill, Los Altos, CA (US);
Krishnaram Kenthapadi, Sunnyvale, CA (US);
Pinar Altin Yilmaz, Palo Alto, CA (US);
Muhammad Bilal Zafar, Berlin, DE;
Pedro L Larroy, Redwood City, CA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Bias metrics may be captured at different stages for training a machine learning model. A training job may specify bias metrics to capture at multiple different stages of a machine learning pipeline for a feature of a training data set used to train a machine learning model. The training job may be executed and the bias metrics determined at the stages as specified in the training job. The bias metrics for the different stages may be stored.