The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Aug. 29, 2023
Applicant:
Rakuten Group, Inc., Tokyo, JP;
Inventors:
Yuki Nakayama, Tokyo, JP;
Koji Murakami, Eastchester, NY (US);
Assignee:
RAKUTEN GROUP, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 40/279 (2020.01); G06F 40/30 (2020.01);
U.S. Cl.
CPC ...
G06F 40/30 (2020.01); G06F 40/279 (2020.01);
Abstract
Provided is a sentiment analysis system including at least one processor configured to: acquire a first comment which relates to a service, and which is input by a user who uses the service; execute clustering relating to the first comment; acquire a sentiment word relating to a sentiment about the service based on an execution result of the clustering; and analyze the sentiment in a first sentence included in the first comment based on the sentiment word.
Nakayama, Yuki. (2026). Sentiment analysis system, sentiment analysis method, and information storage medium (U.S. Patent No. 12547838). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12547838
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile