The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Oct. 26, 2021
Applicant:

Truvalue Labs, Inc., San Francisco, CA (US);

Inventors:

Greg Paul Bala, San Francsico, CA (US);

James Cardamone, San Francsico, CA (US);

Thomas Kuh, San Francsico, CA (US);

Adam Salvatori, San Francsico, CA (US);

Nicole Stelea, San Francsico, CA (US);

Assignee:

TRUVALUE LABS, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/334 (2025.01); G06F 16/3332 (2025.01); G06F 16/338 (2019.01); G06F 40/295 (2020.01); G06F 40/30 (2020.01);
U.S. Cl.
CPC ...
G06F 16/3344 (2019.01); G06F 16/3334 (2019.01); G06F 16/338 (2019.01); G06F 40/295 (2020.01); G06F 40/30 (2020.01);
Abstract

The present disclosure refers to a data processing and retrieval method for dynamically assessing materiality of a signal. A method comprises receiving a list containing a plurality of entities of interest and a plurality of features of interest. Additionally, a plurality of documents containing text describing the features of interest related to the entities of interest can be provided. The method then measures performance of the entities of interest relative to the features of interest.


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