The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Dec. 13, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Albert Maier, Tuebingen, DE;

Dennis Butterstein, Stuttgart, DE;

Alexandre Luz Xavier Da Costa, Stuttgart, DE;

Mike W. Grasselt, Leinfelden-Echterdingen, DE;

Timo Kussmaul, Boeblingen, DE;

Yevgen Karpenko, Schoenaich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/22 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/219 (2019.01); G06F 16/221 (2019.01); G06F 16/254 (2019.01);
Abstract

A computer-implemented method for detecting reference data standardization gaps in data sets is disclosed. The method comprises identifying at least one reference data candidate in a data set, using an index for values of the identified at least one reference data candidate, and determining a difference between an earlier version of a reference data set relating to the reference data candidate and a current version of the reference data set. Furthermore, the method comprises comparing the determined difference with values of the index, and identifying entries in the at least one reference data candidate having a value identical to a value of the difference as reference data standardization gap.


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