The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Sep. 18, 2023
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventors:
Debanjan Datta, Seattle, WA (US);
Gerald Friedland, Alameda, CA (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3692 (2013.01);
Abstract
Techniques for generating synthetic data and/or machine learning model testing are described. For example, synthetic data may be generated according to a request by selecting one or more transformation modules to be used to generate synthetic data, instantiating the selected one or more transformation modules, and applying the selected one or more transformation modules in a defined order to at least one dataset to generate synthetic data.
Datta, Debanjan. (2026). Synthetic data generation and machine learning model testing (U.S. Patent No. 12547530). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12547530
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile