The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Apr. 13, 2022
Oracle International Corporation, Redwood Shores, CA (US);
Vivian Qian Lee, Berkshire, GB;
Hugo Alexandre Pereira Monteiro, London, GB;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for creating a custom metric type to be added to a set of metrics generated by a data monitoring platform at run-time are disclosed. A system receives values defining properties of a custom metric type based on a custom metric template and a custom schema template. The system generates an instruction set, based on the values associated with the custom metric template, for generating the custom metric type on an executing data monitoring system. The system validates the instruction set and the custom schema to verify that the definitions for the custom metric type and the custom schema may be executed by the data monitoring system. The system adds the custom metric type, at run-time, to a set of metrics generated by the data monitoring system.
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