The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

May. 06, 2024
Applicant:

Dell Products, L.p., Hopkinton, MA (US);

Inventors:

Peniel Charles, Bangalore, IN;

Owen Crowley, Carrigaline, IE;

Assignee:

Dell Products, L.P., Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1464 (2013.01);
Abstract

HPC cluster nodes execute instances of an application, and periodically checkpoint data of the executing instances of the application are saved on each of the HPC cluster nodes. The HPC cluster nodes also implement Multi-Path Input/Output (MPIO) software that provide health status reports to a MPIO software management appliance. The MPIO software management appliance uses the health status reports to determine if any of the HPC cluster nodes is in a degraded state. To secure the checkpoint data, the HPC cluster nodes transmit the checkpoint data to a storage array. In response to a determination that one or more of the HPC cluster nodes is in a degraded state, the MPIO software management appliance instructs each of the non-degraded HPC cluster nodes to pause transmission of the checkpoint data to the storage array, to prioritize transmission of checkpoint data from the degraded HPC cluster nodes to the storage array.


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