The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jan. 19, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

David C. Sydow, Merrimack, NH (US);

Anil Kumar Koluguri, Durham, NC (US);

Shreyans Jasoriya, Brighton, MA (US);

Songlin Hou, Worcester, MA (US);

Gajanan S. Natu, Cary, NC (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/41 (2018.01);
U.S. Cl.
CPC ...
G06F 8/43 (2013.01); G06F 8/42 (2013.01);
Abstract

Methods, apparatus, and processor-readable storage media for detecting code anomalies using machine learning techniques are provided herein. An example computer-implemented method includes parsing source code from at least one code repository to create a plurality of tokens based on a syntax corresponding to a programming language of the source code; processing the plurality of tokens using a first machine learning model to create a corresponding plurality of input embeddings; processing the plurality of input embeddings using a second machine learning model, wherein the second machine learning model is configured to detect one or more code anomalies across a plurality of programming languages and trained based at least in part on a training dataset corresponding to the at least one code repository; and causing one or more automated actions to be performed in response to the second machine learning model detecting at least one anomaly in the source code.


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