The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Sep. 09, 2022
Applicants:

Universite DE Bordeaux, Bordeaux, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Institut D'optique Théorique ET Appliquée - Iota, Palaiseau, FR;

Inventors:

Amaury Badon, Mérignac, FR;

Gaëlle Recher, Talence, FR;

Pierre Nassoy, Bordeaux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G02B 21/0048 (2013.01); G02B 21/0052 (2013.01);
Abstract

The invention relates to an optical microscope () and a microscopy method. According to the invention, the microscope comprises an imaging module () comprising an optical beam splitter (), a first optical system (), a first camera (), a second optical system () and a second camera (), the second optical system () and the second camera () being configured to acquire a low-magnification image, and the first optical system () comprising a reflective scanning device () placed in a plane () optically conjugate with the Fourier plane () of the optical microscope (), a controller () being configured to angularly orient the reflective scanning device () so that the first camera () acquires at least one first image (N) of a portion of the object field of the microscope objective ().


Find Patent Forward Citations

Loading…