The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Aug. 12, 2025
Meyer Sound Laboratories, Incorporated, Berkeley, CA (US);
Juan David Sierra Lozano, Abu Dhabi, AE;
Roger Schwenke, Alameda, CA (US);
Swapan Gandhi, El Cerrito, CA (US);
Meyer Sound Laboratories, Incorporated, Berkeley, CA (US);
Abstract
A method for performing transfer function measurements on a device such as a loudspeaker (referred to as a device under test or DUT) using a two-channel transfer function analyzer without a live copy of the DUT test signal. A virtual reference test signal, which is a copy of the DUT test signal, begins playing into a channel of the transfer function analyzer at the estimated start time and estimated play-back speed of the DUT test signal. The known play-back speed of the virtual reference test signal is compared to the estimated play-back speed of the DUT test signal and any detected differences between these two signals compensated for by either adjusting the play-back speed of the virtual reference test signal or the play-back speed of the DUT output, or both. A system for performing this method includes a virtual reference module having a detection part and adjustment part.