The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Oct. 12, 2022
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Reiner Stuhlfauth, Landau, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H01Q 15/14 (2006.01); H04B 7/06 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); H01Q 15/148 (2013.01); H04B 7/0617 (2013.01);
Abstract

The present disclosure provides a test system for testing a device under test, the test system comprising at least one measurement application antenna, and a Reconfigurable Intelligent Surface, RIS, reflector configured to reflect an incoming signal that impinges on the RIS reflector with a predefined impinging angle as reflected signal with a predefined outgoing angle, and a measurement application device coupled to the measurement application antenna and configured to qualify beamforming characteristics of the device under test based on RF signals exchanged between the measurement application device and the device under test via the at least one measurement application antenna and the RIS reflector. Further, the present disclosure provides a respective test method.


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