The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2026
Filed:
Feb. 05, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Eiichiro Takada, Tokyo, JP;
Yoshihiro Yamashita, Tokyo, JP;
Hidetsugu Tanoue, Tokyo, JP;
Masashi Fukaya, Tokyo, JP;
Fumiya Nehashi, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
An automatic analyzer for making measurements for different analysis processes by a compact mechanism. The apparatus performs inspection for plural different analysis processes and includes: an incubator for holding plural reaction vessels on circumferential positions, first and second dispensing mechanisms each having a dispensing nozzle capable of arc-shaped movement around a rotational axis and vertical movement, in which a first locus of an arc-shaped movement of the dispensing nozzle of the first dispensing mechanism and a second locus of the arc-shaped movement of the dispensing nozzle of the second dispensing mechanism intersect the circumference of the incubator where the reaction vessels are arranged, while the first locus and the second locus do not intersect, the first dispensing mechanism is used in a first inspection having a first reaction period, and the second dispensing mechanism is used in a second inspection having a second reaction period longer than the first reaction period.