The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2026

Filed:

Jan. 10, 2022
Applicant:

Meso Scale Technologies, Llc., Rockville, MD (US);

Inventors:

John Joern, Rockville, MD (US);

George Sigal, Rockville, MD (US);

Assignee:

MESO SCALE TECHNOLOGIES, LLC., Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/543 (2013.01); G06F 17/18 (2013.01);
Abstract

Systems and methods for calibrating sample assays are provided. Systems may include assay devices and components for carrying out calibration and sample assays. Systems may further include processing components and storage units configured for receiving calibration information, determining calibration models and parameters, and applying calibration parameters to sample data. Systems may further include components for operating in a networked environment. Methods may include techniques and processes for carrying out calibration and sample assays, determining calibration models and parameters, and applying calibration parameters to sample data.


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